Ayar Labs partners with yieldWerx to accelerate photonics test analytics and yield decisions
Ayar Labs has partnered with test data analytics company yieldWerx to streamline the analysis of complex electro-optical test data, achieving measurable yield and quality improvements within just 30 days.
As Ayar Labs scales its silicon photonics manufacturing, engineering teams faced challenges in ingesting and correlating non-standard test data across wafer-level and final test flows.
The collaboration with yieldWerx enabled the rapid deployment of a secure cloud-based analytics platform capable of handling diverse photonics datasets without custom coding.
Within the first two weeks, raw test data were flowing into the yieldWerx platform, supported by refined data validation and business rules to improve data quality.
By week three, live dashboards provided engineers with wafer maps, outlier detection, and correlation analysis that previously required manual scripting and spreadsheet-based workflows.
In under a month, the system began supporting real-time yield decisions, reducing lot disposition times from days to hours and improving confidence in data-driven engineering insights. Following the initial success, Ayar Labs plans to onboard additional data types, including qualification, reliability, and characterisation data.
The collaboration highlights how advanced analytics platforms can address one of the PIC industry’s persistent challenges, extracting actionable insight from fragmented electro-optical test data, while accelerating yield ramp and time to market for next-generation silicon photonics technologies.
