Teradyne launches Iris 100 microLED tester
Iris 100 provides production-scale optical and electrical testing for microLED devices used in AI data centre connectivity.
Teradyne has introduced Iris 100, a production-ready optical test platform designed to characterise microLED devices for high-volume manufacturing.
The system measures individual emitters across microLED arrays and integrates with Teradyne's UltraFLEXplus automated test platform, enabling combined optical and electrical testing.
MicroLEDs are being developed for applications including augmented reality displays and optical data interconnects for AI data centres. As arrays grow to hundreds of thousands or millions of individual emitters, manufacturers require high-throughput methods to characterise device performance and identify defects.
Iris 100 uses a spectrometer and high-resolution camera to measure spectral response, per-pixel luminance and uniformity across microLED arrays. Teradyne said its parallelised testing and image-processing capabilities can characterise arrays containing millions of emitters while identifying issues including dead or stuck pixels and cluster defects.
The platform also incorporates a NIST-traceable calibration workflow to support measurements across production lots, wafers and manufacturing sites.
“MicroLED is shifting from lab to volume production for both AR microdisplays and, increasingly, optical interconnects,” said Shannon Poulin, president of Teradyne's Semiconductor Test division. “Both technologies demand per-emitter test at production throughput, and Iris 100 delivers that today.”
Iris 100 builds on Teradyne's expansion into photonic testing, following the Photon 100 platform for silicon photonics and co-packaged optics and the company's 2025 acquisition of Quantifi Photonics.
The system supports both wafer and final test, with Teradyne also planning to add photodetector testing capabilities.
Teradyne is showcasing Iris 100 at ECOC 2026, stand 2118, in Málaga, Spain.
