TDK announces new high-speed light-detection technology
The company says its Spin Photo Detector can be directly integrated onto PICs and a variety of substrates, delivering exceptional performance in optical devices requiring ultra-fast detection
TDK Corporation has announced that it has developed the world’s first “Spin Photo Detector,” a photo-spintronic conversion element combining optical, electronic, and magnetic elements that can respond at an ultra-high speed of 20 picoseconds using light with a wavelength of 800 nm – more than 10 times faster than conventional semiconductor-based photodetectors. The company expects this new device to be a key driver for implementing photoelectric conversion technology that boosts data transmission and data processing speed, particularly in AI applications, while simultaneously reducing power consumption.
Transferring mass amounts of data at higher speeds and with lower power consumption is an inevitable need as AI evolves. To process data and make calculations, data is currently transferred between CPU/GPU chips as well as from and to memory by electrical signals. Therefore, there is an increasing need for optical communication and optical interconnects, which offer high speeds that do not decrease with interconnect distance. Photoelectronic conversion technology is also gaining global interest as a very compact fusion of both optical and electronic elements.
To address these challenges, TDK says it has adapted its magnetic tunnel junction (MTJ) technology, which is currently used in billions of HDD heads, for photonics. According to the company, one of the major advantages of this technology is that it does not require crystal growth using a single crystal substrate, and can be directly integrated onto PICs and a variety of substrates.
Comparatively, conventional semiconductor-based photo detectors have physical limitations at shorter wavelengths. Because the Spin Photo Detector has a completely different operating principle and uses an electron heating phenomenon, it can operate at ultra-high speeds even when the wavelength is shortened, TDK says. In addition, the operating wavelength range is wide, and it has been confirmed that it can operate from visible light to near-infrared light, the company adds. TDK has demonstrated the Spin Photo Detector with Nihon University in Japan.
Additionally, with the ability to detect visible light at high speeds, the spin photo detector could be useful in applications projected for future growth, such as devices for AR/VR smart glasses and high-speed image sensors. While conventional semiconductor photo-sensing devices have weak cosmic-ray resistance, MTJ elements are also known for their strong cosmic-ray resistance and could be used as light-detecting elements in aerospace applications. In the future, based on these results, TDK plans to improve the high-speed light detection element to further pursue its usefulness.
