Santec introduces O-band version of swept photonics analyser
Santec, a manufacturer of advanced optical components, tuneable lasers, optical test equipment, and OCT systems, has announced the product launch of the O-band version of its swept photonics analyser (SPA-100).
The Santec SPA-100, previously exclusive to the CL band, is now accessible in an O-band configuration (1260 nm to 1350 nm). The company says that the system leverages the sweeping range of the Santec TSL, maintaining its position as the market’s highest resolution reflectometer (<6 µm). Like its CL band counterpart, the O-band version is well-suited for analysing compact components such as photonic integrated circuits (PICs), fibre optic elements, and short cable assemblies due to its sub-6µm resolution.
The provided software presents a trace illustrating reflectance and loss events, offering the ability to pinpoint faults and assess parameters like waveguide length and refractive index.
Beyond yielding a reflectance trace, the SPA-100 system uses coherent detection technology to perform transmissive wavelength-dependent loss measurement with a wide dynamic range of better than 70 dB in a single scan, saving measurement time with no need to change optical power meter ranges.
A patented proximity sensing function allows for the fibre probe itself to sense the distance between the probe and the silicon wafer to facilitate the alignment process during the wafer level characterization process in a silicon photonic chip production line.